Dac Inl Error

removed. (July 2008) (Learn how and when to remove this template message) Integral nonlinearity (acronym INL) is the maximum deviation between the ideal output of a DAC and the actual output

Dac Inl Dnl Measurement

level (after offset and gain errors have been removed). The term is often dac inl dnl calculation used as an important specification for measuring error in a digital-to-analog converter (DAC). The transfer function of a DAC should dac inl dnl matlab ideally be a line and the INL measurement depends on the ideal line selected. Two often used lines are the best fit line, which is the line that minimizes the INL result

Wiki Dac

and the endpoint line which is a line that passes through the points on the transfer function corresponding to the lowest and highest input code. In all cases, the INL is the maximum distance between the ideal line selected and the actual transfer function. Formula[edit] For the line through the endpoints, the INL of a DAC is I N L = max 0 ≤ c ≤

Offset Error In Adc

c max | V o u t [ c ] − V o u t [ 0 ] − c ⋅ m | {\displaystyle \mathrm {INL} =\max _{0\leq c\leq c_{\max }}\left|V_{\mathrm {out} }[c]-V_{\mathrm {out} }[0]-c\cdot m\right|} where m = V o u t [ c max ] − V o u t [ 0 ] c max {\displaystyle m={\frac {V_{\mathrm {out} }[c_{\max }]-V_{\mathrm {out} }[0]}{c_{\max }}}} is the slope of the line through the end points, and V o u t [ c ] {\displaystyle V_{\mathrm {out} }[c]} is the output voltage at code c. This assumes that the minimum code is 0. This INL is measured in volts; one can divide it by the ideal LSB voltage to get the measurement in LSBs.. See also[edit] Differential nonlinearity External links[edit] INL/DNL Measurements for High-Speed Analog-to-Digital Converters (ADCs) Application Note 283 by Maxim This electronics-related article is a stub. You can help Wikipedia by expanding it. v t e Retrieved from "https://en.wikipedia.org/w/index.php?title=Integral_nonlinearity&oldid=702643481" Categories: Digital signal processingElectronics stubsHidden categories: Articles lacking sources from July 2008All articles lacking sourcesAll stub articles Navigation menu Personal tools Not logged inTalkContributionsCreate accountLog in Namespaces Article Talk Variants Views Read Ed

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Nonlinearity Error Formula

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Федерация 中国 (China) 日本 (Japan) 대한민국 (Korea) 台灣 (Taiwan) See All Countries Toggle navigation INNOVATIONS SHOP SUPPORT COMMUNITY United States DAC INL and DNL Measurement Reference Design Publish Date: Oct 12, 2011 | 3 Ratings | 4.67 out of 5 | Print Overview This example http://www.ni.com/white-paper/8218/en/ performs Integral Non-Linearity (INL) and Differential Non-Linearity (DNL) tests on a digital to analog converter (DAC) using the National Instruments PXI platform.  Table of Contents Configuring the Hardware Configuring the Software Overview INL and DNL measurements are performed on Analog to Digital Converters (ADCs) and Digital to Analog Converters (DACs) to verify their performance characteristics. Together with gain and offset errors, INL and DNL measurements define the device’s static error specifications. For dac inl DACs, a typical approach for making INL measurements is to supply a digital ramp to the DAC inputs and to then compare the DAC’s acquired response to an ideal response. Fig 1:Conceptual Hardware Setup for Testing INL/DNL There are two commonly accepted methods for choosing the ideal response for INL measurement analysis. The best fitmethod minimizes the error by choosing a reference line that best matches the DAC response measurements. The dac inl dnl end point method uses the first and last measurements as the ends of the reference line. In either case, the INL measurement is defined as the worst-case deviation between the measurement and the ideal response, and the DNL measurement is defined as the largest incremental error between successive output measurements. 1. Configuring the Hardware This reference design uses a PXI-6552 or PXI-6542 high-speed DIO board to generate the ramp and a PXI-5922 flexible resolution digitizer to measure analog output voltage. Although a digitizer is used here to accelerate the measurements, a DMM could also be used to measure the DAC response. Other system components include the DAC clock source (in this case supplied by the HSDIO board) and a low noise power supply provided with a PXI-4130 source measurement unit to power the DAC. Hardware Connections Figure 2 below shows how to connect the instruments to the DAC. Fig 2: Hardware Diagram illustrating connections between NI hardware and DAC DUT Board To summarize the connections between the instruments and the DUT: • Power the DAC chip using SMU Channel 1 • Connect the HSDIO data output lines to the DUT digital inputs •Connect the HSDIO CLK OUT to the DUT clock input •Wire the DAC analog output to the digitizer inputs using a differential

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