Error Signal Artifact In Apertureless Scanning Near Field Optical Microscopy
Society of America American Association of Physicists in Medicine American Association of Physics Teachers American Crystallographic Association, Inc. Chinese Physical Society Laser Institute of America The Society of Rheology » View All Publishers Publications Topics Collections | Librarians Authors My Cart Home > Publishers > AIP Publishing > Applied Physics Letters > Volume 89, Issue 9 > Article No data available. Please log in to see this content. You have no subscription access to this content. No metrics data to plot. The attempt to load metrics for this article has failed. The attempt to plot a graph for these metrics has failed. The full text of this article is not currently available. f Erratum: “Error signal artifact in apertureless scanning near-field optical microscopy” [Appl. Phys. Lett.89, 023105 (2006)] L. Billot1, M. Lamy de la Chapelle1, D. Barchiesi1, S.-H. Chang2, S. K. Gray2, J. A. Rogers3, A. Bouhelier4, P.-M. Adam5, J.-L. Bijeon5, G. P. Wiederrecht6, R. Bachelot7and P. Royer7 Scitation Author Page PubMed Google Scholar View Affiliations Hide Affiliations Affiliations: 1 Institut Charles Delaunay CNRS FRE 2848, Laboratoire de Nanotechnologie et d’Instrumentation Optique, Université de Technologie de Troyes, 12, rue Marie Curie, BP2060.10010 Troyes cedex, France 2 Chemistry Division and Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 3 Department of Materials Science and Engineering, Department of Chemistry, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 4 Chemistry Division and Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 5 Institut Charles Delaunay CNRS FRE 2848, Laboratoire de Nanotechnologie et d’Instrumentation Optique, Université de Technologie de Troyes, 12, rue Marie Curie, BP2060.10010 Troyes cedex, France 6 Chemistry Division and Center for Nanoscale Ma
is experimenting with adspdfError signal artifact in apertureless scanning near-field optical microscopy4 PagesError signal artifact in apertureless http://scitation.aip.org/content/aip/journal/apl/89/9/10.1063/1.2338883 scanning near-field optical microscopyUploaded byLaurent BillotFiles1of 2Error_signal_artifact_...www.researchgate.net/p...Viewsconnect to downloadGetpdfREAD PAPERError signal artifact in apertureless scanning near-field optical microscopyDownloadError signal artifact in apertureless scanning http://www.academia.edu/21828499/Error_signal_artifact_in_apertureless_scanning_near-field_optical_microscopy near-field optical microscopyUploaded byLaurent BillotLoading PreviewSorry, preview is currently unavailable. You can download the paper by clicking the button above.GET pdf ×CloseLog InLog InwithFacebookLog InwithGoogleorEmail:Password:Remember me on this computerorreset passwordEnter the email address you signed up with and we'll email you a reset link.Need an account?Click here to sign up Job BoardAboutPressBlogPeoplePapersTermsPrivacyCopyrightWe're Hiring!Help Center Find new research papers in:PhysicsChemistryBiologyHealth SciencesEcologyEarth SciencesCognitive ScienceMathematicsComputer Science Academia © 2016
Citations to the Article · Reads History Translate This Page Title:Error signal artifact in apertureless scanning near-field optical microscopy http://adsabs.harvard.edu/abs/2006ApPhL..89b3105B Authors:Billot, L.; Lamy de la Chapelle, M.; Barchiesi, D.; Chang, S.-H.; Gray, S. K.; Rogers, J. A.; Bouhelier, A.; Adam, P.-M.; Bijeon, J.-L.; Wiederrecht, G. P.; Bachelot, R.; Royer, P. http://ieeexplore.ieee.org/iel5/4816218/4823092/04823180.pdf Affiliation:AA(Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 Rue Marie Curie, BP 2060, 10010 Troyes Cedex, France; Department of Materials Science and Engineering and Department of Chemistry, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801; error signal Chemistry Division and Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439; Department of Materials Science and Engineering and Department of Chemistry, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801; Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 Rue Marie Curie, error signal artifact BP 2060, 10010 Troyes Cedex, France; Department of Materials Science and Engineering and Department of Chemistry, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801; Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 Rue Marie Curie, BP 2060, 10010 Troyes Cedex, France), AB(Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 Rue Marie Curie, BP 2060, 10010 Troyes Cedex, France; Department of Materials Science and Engineering and Department of Chemistry, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801; Chemistry Division and Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439; Department of Materials Science and Engineering and Department of Chemistry, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801; Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 Rue Marie Curie, BP 2060, 10010 Troyes Cedex, France; Department of Materials Science and Engineering and Department of Chemistry
Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General Topics for Engineers Geoscience Nuclear Engineering Photonics & Electro-Optics Power, Energy, & Industry Applications Robotics & Control Systems Signal Processing & Analysis Transportation Browse Books & eBooks Conference Publications Courses Journals & Magazines Standards By Topic My Settings Content Alerts My Projects Search Alerts Preferences Purchase History Search History What can I access? Get Help About IEEE Xplore Feedback Technical Support Resources and Help Terms of Use What Can I Access? Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search Other Search Options Command Search Citation Search Search Alerts Search History Sign In Username: Password: Forgot password Other Authentication Options Create an IEEE Account Don't have an IEEE Accountyet? Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile and order history Personal Sign In Create Account IEEE Account Change Username/Password Update Address Purchase Details Payment Options Order History View Purchased Documents Profile Information Communications Preferences Profession and Education Technical Interests Need Help? US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out of Cookies A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.© Copyright 2016 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.