Micro-architectural Error
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Whea Uncorrectable Error
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Bugcheck 124
BSOD showing 0x00000124 error code 14 May 2012 #1 muhemmedirfan Windows 7 Home Premium x64 6 posts BSOD showing 0x00000124 error code Hi guys, I have been getting this error message
Machine Check Exception
recently. The computer would automatically restart after showing the BSOD. I am new to debugging anf don't know much details of debugging etc. Your help is required plz. Basic system info: Sony Vaio VPCCW2PFX/R OS: Windows 7 Home Premium x64 SP1 (Reinstalled in Jan 2012) Make: OEM installed Windows (Genuine registered copy) System (hardware) is almost 2 years old I have also attached the dump files. Please let intel 64 and ia 32 architectures software developer's manual me know if any clarification is required. Regards ... Irfan My System Specs OS Windows 7 Home Premium x64 muhemmedirfan View Public Profile Find More Posts by muhemmedirfan . 14 May 2012 #2 Vir Gnarus Windows 7 64-bit 1,317 posts Majority of your crashes are 0x124 bugchecks, yes. These are caused by WHEA (Windows Hardware Error Architecture) triggering due to a hardware fault. If you wanna know how to interpret them, you'll need to grab Debugging Tools for Windows (aka WinDBG, from the Windows WDK) and then run the !errrec command followed by the memory address mentioned in the second argument for the bugcheck. The 4 numbers after the crash error code (0x124) are the 4 arguments. Doing that will bring all the results from the WHEA error structure telling you details on what went wrong. Example below: Code: ... ******************************************************************************* * * * Bugcheck Analysis * * * ******************************************************************************* Use !analyze -v to get detailed debugging information. BugCheck 124, {0, fffffa80058a6028, be000000, 800400} TRIAGER: Could not open triage file : C:\Program Files (x86)\Windows Kits\8.0\Debuggers\x64\triage\modclass.ini, error 2 Probably caused by : GenuineIntel Followup: MachineOwner --------- 0: kd> !errrec fffffa80058a6028 =============================================================================== Common Platform Error Record @ fffffa80058a6028 ----------------------------------------------------------------------
List Forum Actions Mark Forums Read Quick Links View Site Leaders View machine check exception windows 10 Site Contributors Server Status Tutorials About Rules What's New? windows for mac Activity Stream New Articles Mark Forums Read Driver Reference Table Common BSOD Related Drivers windbg Donate Close menu Log in Register Forum Microsoft Support & Malware Removal BSOD, Crashes, Kernel Debugging WHEA error for a MCA fault WHEA http://www.sevenforums.com/bsod-help-support/229744-bsod-showing-0x00000124-error-code.html error for a MCA fault 07-31-2012,12:21 PM #1 Capt.Jack Sparrow View Profile View Forum Posts View Blog Entries Visit Homepage View Articles Visiting ExpertBSOD Kernel Dump Expert Join Date Apr 2012 Posts110 WHEA error for a MCA fault I was analyzing a 0x124 bugcheck Code: WHEA_UNCORRECTABLE_ERROR https://www.sysnative.com/forums/bsod-crashes-kernel-debugging/3077-whea-error-mca-fault.html (124) A fatal hardware error has occurred. Parameter 1 identifies the type of error source that reported the error. Parameter 2 holds the address of the WHEA_ERROR_RECORD structure that describes the error conditon. Arguments: Arg1: 0000000000000000, Machine Check Exception Arg2: fffffa800cfe8028, Address of the WHEA_ERROR_RECORD structure. Arg3: 00000000fa000000, High order 32-bits of the MCi_STATUS value. Arg4: 0000000000400405, Low order 32-bits of the MCi_STATUS value. Debugging Details: ------------------ BUGCHECK_STR: 0x124_GenuineIntel CUSTOMER_CRASH_COUNT: 1 DEFAULT_BUCKET_ID: VISTA_DRIVER_FAULT PROCESS_NAME: System CURRENT_IRQL: f STACK_TEXT: fffff880`0391db58 00000000`00000000 : 00000000`00000000 00000000`00000000 00000000`00000000 00000000`00000000 : nt!KeBugCheckEx STACK_COMMAND: kb FOLLOWUP_NAME: MachineOwner MODULE_NAME: hardware IMAGE_NAME: hardware DEBUG_FLR_IMAGE_TIMESTAMP: 0 FAILURE_BUCKET_ID: X64_0x124_GenuineIntel_PROCESSOR_MAE BUCKET_ID: X64_0x124_GenuineIntel_PROCESSOR_MAE Followup: MachineOwner I looked at WHEA error record Code: 6: kd> !errrec fffffa800cfe8028 =============================================================================== Common Platform Error Record @ fffffa800cfe8028 ------------------------------------------------------------------------------- Record Id : 01cd6ebe45bc0523 Severity : Fatal (1) Length : 928 Creator : Microsoft Not
εμάς.Μάθετε περισσότερα Το κατάλαβαΟ λογαριασμός μουΑναζήτησηΧάρτεςYouTubePlayΕιδήσειςGmailDriveΗμερολόγιοGoogle+ΜετάφρασηΦωτογραφίεςΠερισσότεραΈγγραφαBloggerΕπαφέςHangoutsΑκόμη περισσότερα από την GoogleΕίσοδοςΚρυφά πεδίαΒιβλίαbooks.google.gr https://books.google.com/books?id=yExiPEievyUC&pg=PA23&lpg=PA23&dq=micro-architectural+error&source=bl&ots=xL5QNWo6Qq&sig=7Yew-5n4wowAWWya4d6KFvt9iz0&hl=en&sa=X&ved=0ahUKEwjJ8rvujeLPAhXn7YMKHeZrAegQ6AEISzAF - Our investigation begins with deep analysis of how transient faults affect microprocessors. We find that https://books.google.com/books?id=COllqyJGYZEC&pg=PA51&lpg=PA51&dq=micro-architectural+error&source=bl&ots=ftN3IvkCzd&sig=gso-MbdyGxAKHPa6VFVYvNv5b6Q&hl=en&sa=X&ved=0ahUKEwjJ8rvujeLPAhXn7YMKHeZrAegQ6AEIVzAI fault masking is prevalent in modern processors and identify portions of processors that are particularly vulnerable machine check to faults. Next, we observe that many soft errors share distinguishing attributes....https://books.google.gr/books/about/Cost_Effective_Soft_Error_Mitigation_in.html?hl=el&id=yExiPEievyUC&utm_source=gb-gplus-shareCost Effective Soft Error Mitigation in MicroprocessorsΗ βιβλιοθήκη μουΒοήθειαΣύνθετη Αναζήτηση ΒιβλίωνΑποκτήστε το εκτυπωμένο βιβλίοΔεν υπάρχουν διαθέσιμα eBookProQuestΕύρεση σε κάποια βιβλιοθήκηΌλοι οι πωλητές»Αγορά machine check exception βιβλίων στο Google PlayΠεριηγηθείτε στο μεγαλύτερο ηλεκτρονικό βιβλιοπωλείο του κόσμου και ξεκινήστε να διαβάζετε σήμερα στον ιστό, το tablet, το τηλέφωνο ή το ereader σας.Άμεση μετάβαση στο Google Play »Cost Effective Soft Error Mitigation in MicroprocessorsNicholas J. WangProQuest, 2007 - 147 σελίδες 0 Κριτικέςhttps://books.google.gr/books/about/Cost_Effective_Soft_Error_Mitigation_in.html?hl=el&id=yExiPEievyUCOur investigation begins with deep analysis of how transient faults affect microprocessors. We find that fault masking is prevalent in modern processors and identify portions of processors that are particularly vulnerable to faults. Next, we observe that many soft errors share distinguishing attributes. We leverage those attributes and repurpose already existing microarchite
εμάς.Μάθετε περισσότερα Το κατάλαβαΟ λογαριασμός μουΑναζήτησηΧάρτεςYouTubePlayΕιδήσειςGmailDriveΗμερολόγιοGoogle+ΜετάφρασηΦωτογραφίεςΠερισσότεραΈγγραφαBloggerΕπαφέςHangoutsΑκόμη περισσότερα από την GoogleΕίσοδοςΚρυφά πεδίαΒιβλίαbooks.google.gr - Next, this thesis investigates how this increased resilience can be traded off for higher-density bitcells, higher cell performance, greater cell stability, and lower power design by correcting variability-induced manufacture-time hard errors in embedded memory arrays, while maintaining ∼100% yield....https://books.google.gr/books/about/Two_dimensional_Memory_System_Protection.html?hl=el&id=COllqyJGYZEC&utm_source=gb-gplus-shareTwo-dimensional Memory System ProtectionΗ βιβλιοθήκη μουΒοήθειαΣύνθετη Αναζήτηση ΒιβλίωνΑποκτήστε το εκτυπωμένο βιβλίοΔεν υπάρχουν διαθέσιμα eBookProQuestΕύρεση σε κάποια βιβλιοθήκηΌλοι οι πωλητές»Αγορά βιβλίων στο Google PlayΠεριηγηθείτε στο μεγαλύτερο ηλεκτρονικό βιβλιοπωλείο του κόσμου και ξεκινήστε να διαβάζετε σήμερα στον ιστό, το tablet, το τηλέφωνο ή το ereader σας.Άμεση μετάβαση στο Google Play »Two-dimensional Memory System ProtectionProQuest, 2008 - 132 σελίδες 0 Κριτικέςhttps://books.google.gr/books/about/Two_dimensional_Memory_System_Protection.html?hl=el&id=COllqyJGYZECNext, this thesis investigates how this increased resilience can be traded off for higher-density bitcells, higher cell performance, greater cell stability, and lower power design by correcting variability-induced manufacture-time hard errors in embedded memory arrays, while maintaining ∼100% yield. By conducting a series of Monte Carlo simulations of scaled cell models with device variability, this thesis first identifies a strong potential of using multi-bit ECC for variability tolerance, and then proposes 2D erasure coding, a low-overhead multi-bit ECC desig